Scanning Probe Microscopy and Quantum Transport Measurement
SPECS Nanonis Mimea SPM controllers control system is adaptable to most commercial SPM systems with plug and play adaptation kits. Suitable for a wide range of applications ranging from tunneling microscopy and spectroscopy to SNOM, non-contact AFM, and special setups for more complex measurements. It combines exceptional signal quality, high speed, and a flexible, powerful and user-friendly software interface.
SPECS Nanonis Tramea™ quantum transport measurement system – the novel and superior approach to transport measurements with measurement speed faster than 1000x compared to conventional acquisition systems, smaller footprint, plenty of signals and a powerful and customizable user interface.
Systems & Accessories
Multiprobe controller
Operating a multiprobe SPM system has never been simpler: The Nanonis Mimea™ multiprobe control system is an easy to use yet scalable solution offering the best performance to cost ratio for any number of probes.
Multiprobe systems typically have between 2 and 5 probes and the control system should be able to handle every possible configuration. Previous solutions were either designed for the maximum number of probes, resulting in an expensive configuration for fewer probes, or used multiple single-probe controllers resulting in complex workflow and poor usability.
Nanonis Mimea™ is a modular platform which easily grows with the number of probes while maintaining a single-controller architecture with all measurements managed and all data handled by one user interface.
SPM Controller
A range of adaptation kits enable seamless integration of the Nanonis control system with most types of commercial SPMs. The adaptation kits are pin-compatible with the microscopes providing plug&play integration.
The following adaptation kits are available:
- SPECS Aarhus SPM family
- Omicron STMs and AFMs
- Unisoku SPMs
- Beetle-type SPMs
- Createc SPMs
- Veeco Multimode
- JEOL 4000 series UHV AFM/STM and 5200 series AFM
- JEOL 5400 series AFM
Features
2D- and 3D-spectroscopy
Advanced spectroscopy modules allow for experiments at a single point, along a line, a cloud of arbitrary points or a regularly spaced grid, including combined grid and scanning mode that can have different pixel densities. All pattern types can run scripted spectroscopy.
- Fast spectroscopy module with up to 1’000’000 pixel/s, fully adjustable timing parameters, access to any output signal and option to run in time spectroscopy mode.
- Z-spectroscopy with user-defined retract condition.
- Dual-setpoint retract condition for Z-spectroscopy on molecules.
- Bias spectroscopy with up to 20’000 pixels/s, variable bias point spacing and 7 timing parameters available before, during and after the spectroscopy sweep.
- Fast synchronization with external instruments at each point using TTL trigger lines is also possible.
- Generic sweeper: sweep one of 13 possible signals (8 physical outputs and 5 internally calculated) while recording any other channels.
- Fast custom experiments with real-time scripting.
- Custom experiments programmed in the Programming Interface.
Optimized user experience
The software design has been optimized for more efficient workflow, resulting in a streamlined and simpler design compared to previous generations. With software-based instruments becoming more and more of a standard, the software departs from its hardware ties and makes any user feel at home quicker thanks to its modern, yet timeless design.
Interactive scan control
Three modes are integrated in this module: ‘Scan’, ‘Follow-me’ and ‘Spectroscopy’. All scan parameters can be adjusted on-the-fly without delay during scanning, and it is possible to zoom, navigate and paste multiple scanned images to the background for reference. Any of the 24 signals can be displayed in multiple windows. Pause then resume scan with no data loss after tip cleaning, spectroscopy, or manipulation. The motion of the tip is visualized in real-time when scanning or positioning with the mouse.
Spectrum analyzer, graphs and oscilloscopes
- Dual channel oscilloscope with post- and pre-trigger.
- Spectrum analyzer: continuous display of any of the 128 channels in the frequency domain.
- Signal charts and history: rolling charts for continuous data monitoring and acquisition.
- Long term spectrum: record data over hours or days to discriminate environmental effects from the microscope measurements.
- All analyzers, graphs and oscilloscopes are completely independent and can run at the same time as image scans and spectroscopy allowing the same channels to be acquired in both time and frequency domain as well as in a conventional manner simultaneously.
Oscillation controller
The Oscillation Controller (OC4) and the related software modules add dynamic and multifrequency AFM capabilities to the Nanonis controller. Imaging modes include but are not limited to: non-contact AFM, intermittent contact mode, phase imaging, dissipation.
With an input bandwidth of 5MHz, the OC4 can operate any type of cantilever, tuning fork, Kolibri sensor™, etc. at its fundamental frequency or higher harmonics. It is also perfect as a digital lock-in and signal analyzer (FFT) up to 5 MHz and can be further extended for Kelvin probe applications or customized in LabVIEW with the Nanonis Programming Interface.
The z-feedback of the SPM software can regulate on any signal coming from the mechanical resonator with any predefined SafeTip™ condition.
Atom tracking
The Atom tracking module adds atom tracking capability to the Nanonis base package. It is designed to track topographical features (not only atoms) dynamically and can therefore measure and compensate for thermal drift and sample tilt. A fully automated procedure automatically calculates drift velocity and sample tilt in both X and Y-directions as well as drift in Z-direction and compensates for these. This module is of particular interest when the tip position has to follow a local extremum (e.g. an atom or molecule, maximum or minimum) between point-spectroscopy or when scanning a small scan area where drift is highly noticeable.
Combined with custom spectroscopy scripts the atom tracking module is a powerful tool. It ensures that measurement sequences lasting several hours can be performed without losses in postitioning accuracy. Its tight integration with the Nanonis software simplifies this otherwise cumbersome operation significantly.
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